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Low frequency noise assessment for deep submicron CMOS technology nodes

dc.contributor.authorClaeys, Cor
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-15T12:53:11Z
dc.date.available2021-10-15T12:53:11Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8691
dc.sourceIIOimport
dc.titleLow frequency noise assessment for deep submicron CMOS technology nodes
dc.typeJournal article
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpageG307
dc.source.endpageG317
dc.source.journalJournal of the Electrochemical Society
dc.source.issue5
dc.source.volume151
imec.availabilityPublished - imec


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