Correlation between the low-frequency noise spectral density and the static device parameters of silicon-on-insulator MOSFET's
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, C. | |
dc.date.accessioned | 2021-09-29T13:16:30Z | |
dc.date.available | 2021-09-29T13:16:30Z | |
dc.date.issued | 1995 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/869 | |
dc.source | IIOimport | |
dc.title | Correlation between the low-frequency noise spectral density and the static device parameters of silicon-on-insulator MOSFET's | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.beginpage | 1467 | |
dc.source.endpage | 72 | |
dc.source.journal | IEEE Trans. Electron Devices | |
dc.source.issue | 8 | |
dc.source.volume | 42 | |
imec.availability | Published - imec |
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