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Static characteristics of gate-all-around SOI MOSFETs at cryogenic temperatures

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T13:16:38Z
dc.date.available2021-09-29T13:16:38Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/875
dc.sourceIIOimport
dc.titleStatic characteristics of gate-all-around SOI MOSFETs at cryogenic temperatures
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage635
dc.source.endpage642
dc.source.journalPhysica Status Solidi A
dc.source.issue2
dc.source.volume148
imec.availabilityPublished - open access


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