Show simple item record

Substrate bias effect on the random telegraph signal parameters in submicrometer silicon p-metal-oxide-semiconductor transistors

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, C.
dc.date.accessioned2021-09-29T13:16:41Z
dc.date.available2021-09-29T13:16:41Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/877
dc.sourceIIOimport
dc.titleSubstrate bias effect on the random telegraph signal parameters in submicrometer silicon p-metal-oxide-semiconductor transistors
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage910
dc.source.endpage14
dc.source.journalJ. Appl. Phys.
dc.source.issue2
dc.source.volume77
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record