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High-energy proton irradiation effects on tunnelling MOS capacitors

dc.contributor.authorFleta, C.
dc.contributor.authorCampabadal, F.
dc.contributor.authorRafi, Joan Marc
dc.contributor.authorLozano, M.
dc.contributor.authorUlan, M.
dc.date.accessioned2021-10-15T13:24:55Z
dc.date.available2021-10-15T13:24:55Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8906
dc.sourceIIOimport
dc.titleHigh-energy proton irradiation effects on tunnelling MOS capacitors
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage85
dc.source.endpage89
dc.source.journalMicroelectronic Engineering
dc.source.issue1_4
dc.source.volume72
imec.availabilityPublished - imec
imec.internalnotesPaper from INFOS 2003


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