Show simple item record

Oxygen-deficiency centers in SiO2 thermally nitrided in NO

dc.contributor.authorGarcia Tello, Pablo
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorStesmans, Andre
dc.date.accessioned2021-10-15T13:30:52Z
dc.date.available2021-10-15T13:30:52Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8938
dc.sourceIIOimport
dc.titleOxygen-deficiency centers in SiO2 thermally nitrided in NO
dc.typeJournal article
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.imecauthorStesmans, Andre
dc.source.peerreviewno
dc.source.beginpage81
dc.source.endpage84
dc.source.journalMicroelectronic Engineering
dc.source.issue1_4
dc.source.volume72
imec.availabilityPublished - imec
imec.internalnotesPaper from INFOS 2003


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record