dc.contributor.author | Gonzalez, Mario | |
dc.contributor.author | Vandevelde, Bart | |
dc.contributor.author | Van Hoof, Rita | |
dc.contributor.author | Beyne, Eric | |
dc.date.accessioned | 2021-10-15T13:37:06Z | |
dc.date.available | 2021-10-15T13:37:06Z | |
dc.date.issued | 2004-12 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8970 | |
dc.source | IIOimport | |
dc.title | Characterization and FE analysis on the shear test of electronic materials | |
dc.type | Journal article | |
dc.contributor.imecauthor | Gonzalez, Mario | |
dc.contributor.imecauthor | Vandevelde, Bart | |
dc.contributor.imecauthor | Van Hoof, Rita | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Vandevelde, Bart::0000-0002-6753-6438 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.source.peerreview | no | |
dc.source.beginpage | 1915 | |
dc.source.endpage | 1921 | |
dc.source.journal | Microelectronics Reliability | |
dc.source.issue | 12 | |
dc.source.volume | 44 | |
imec.availability | Published - imec | |