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Characterization and FE analysis on the shear test of electronic materials

dc.contributor.authorGonzalez, Mario
dc.contributor.authorVandevelde, Bart
dc.contributor.authorVan Hoof, Rita
dc.contributor.authorBeyne, Eric
dc.date.accessioned2021-10-15T13:37:06Z
dc.date.available2021-10-15T13:37:06Z
dc.date.issued2004-12
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8970
dc.sourceIIOimport
dc.titleCharacterization and FE analysis on the shear test of electronic materials
dc.typeJournal article
dc.contributor.imecauthorGonzalez, Mario
dc.contributor.imecauthorVandevelde, Bart
dc.contributor.imecauthorVan Hoof, Rita
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecVandevelde, Bart::0000-0002-6753-6438
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.source.peerreviewno
dc.source.beginpage1915
dc.source.endpage1921
dc.source.journalMicroelectronics Reliability
dc.source.issue12
dc.source.volume44
imec.availabilityPublished - imec


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