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Partial scan and symbolic test at the register-transfer level

dc.contributor.authorSteensma, Johannes
dc.contributor.authorCatthoor, Francky
dc.contributor.authorDe Man, Hugo
dc.date.accessioned2021-09-29T13:17:21Z
dc.date.available2021-09-29T13:17:21Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/899
dc.sourceIIOimport
dc.titlePartial scan and symbolic test at the register-transfer level
dc.typeJournal article
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorDe Man, Hugo
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage7
dc.source.endpage23
dc.source.journalJournal of Electronic Testing
dc.source.issue1_2
dc.source.volume7
imec.availabilityPublished - open access


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