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Radiation and Impurity Related Deep Levels in Si: A Deep Level Transient Spectroscopy Study Correlated with Other Spectroscopic Techniques

dc.contributor.authorTrauwaert, Marie-Astrid
dc.date.accessioned2021-09-29T13:18:00Z
dc.date.available2021-09-29T13:18:00Z
dc.date.issued1995-12
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/917
dc.sourceIIOimport
dc.titleRadiation and Impurity Related Deep Levels in Si: A Deep Level Transient Spectroscopy Study Correlated with Other Spectroscopic Techniques
dc.typePHD thesis
dc.source.peerreviewno
imec.availabilityPublished - imec
imec.internalnotesThesis Advisors : Prof. Dr. G. Langouche and Prof. Dr. Ir. H.E. Maes


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