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Short-channel effects in the Lorentzian noise induced by the EVB tunneling in partially depleted SOI MOSFETs

dc.contributor.authorLukyanchikova, N.
dc.contributor.authorGarbar, N.
dc.contributor.authorSmolanka, A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-15T14:35:31Z
dc.date.available2021-10-15T14:35:31Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9232
dc.sourceIIOimport
dc.titleShort-channel effects in the Lorentzian noise induced by the EVB tunneling in partially depleted SOI MOSFETs
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.source.peerreviewno
dc.source.beginpage747
dc.source.endpage758
dc.source.journalSolid-State Electronics
dc.source.issue5
dc.source.volume48
imec.availabilityPublished - imec


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