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Hot carrier degradation phenomena in lateral and vertical DMOS transistors

dc.contributor.authorMoens, Peter
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-15T14:56:18Z
dc.date.available2021-10-15T14:56:18Z
dc.date.issued2004-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9312
dc.sourceIIOimport
dc.titleHot carrier degradation phenomena in lateral and vertical DMOS transistors
dc.typeJournal article
dc.contributor.imecauthorMoens, Peter
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.source.peerreviewno
dc.source.beginpage623
dc.source.endpage628
dc.source.journalIEEE Trans. Electron Devices
dc.source.issue4
dc.source.volume51
imec.availabilityPublished - imec


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