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A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures

dc.contributor.authorNakabayashi, M.
dc.contributor.authorOhyama, H.
dc.contributor.authorHanano, N.
dc.contributor.authorKamiya, T.
dc.contributor.authorHirao, T.
dc.contributor.authorTakakura, K.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-15T15:03:25Z
dc.date.available2021-10-15T15:03:25Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9339
dc.sourceIIOimport
dc.titleA study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage676
dc.source.endpage679
dc.source.journalNuclear Instruments & Methods in Physics Research B
dc.source.volume219-220
imec.availabilityPublished - open access
imec.internalnotes16th Int. Conf. Ion Beam Analysis; Albuquerque, NM, USA; July 2003


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