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DLTS studies of high-temperature electron irradiated Cz n-Si

dc.contributor.authorNeimash, V.
dc.contributor.authorKras'ko, M.
dc.contributor.authorKraitchinskii, A.
dc.contributor.authorVoytivych, V.
dc.contributor.authorTishenko, V.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRafi, Joan Marc
dc.contributor.authorClaeys, Cor
dc.contributor.authorVersuys, J.
dc.contributor.authorDe Gryse, O.
dc.contributor.authorClauws, P.
dc.date.accessioned2021-10-15T15:04:14Z
dc.date.available2021-10-15T15:04:14Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9342
dc.sourceIIOimport
dc.titleDLTS studies of high-temperature electron irradiated Cz n-Si
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage509
dc.source.endpage516
dc.source.journalPhysica Status Solidi A
dc.source.issue3
dc.source.volume201
imec.availabilityPublished - imec


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