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On the atomistic details of electromigration-induced drift

dc.contributor.authorProost, Joris
dc.contributor.authorD'Haen, Jan
dc.contributor.authorJin, M.
dc.contributor.authorVerlinden, B.
dc.date.accessioned2021-10-15T15:38:27Z
dc.date.available2021-10-15T15:38:27Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9470
dc.sourceIIOimport
dc.titleOn the atomistic details of electromigration-induced drift
dc.typeJournal article
dc.contributor.imecauthorD'Haen, Jan
dc.source.peerreviewno
dc.source.beginpage267
dc.source.endpage271
dc.source.journalScripta Materialia
dc.source.issue2
dc.source.volume50
imec.availabilityPublished - imec


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