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Investigation of the soft-write mechanism in source-side injection flash EEPROM devices

dc.contributor.authorVan Houdt, Jan
dc.contributor.authorWellekens, Dirk
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-29T13:20:00Z
dc.date.available2021-09-29T13:20:00Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/949
dc.sourceIIOimport
dc.titleInvestigation of the soft-write mechanism in source-side injection flash EEPROM devices
dc.typeJournal article
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorWellekens, Dirk
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewno
dc.source.beginpage181
dc.source.endpage3
dc.source.journalIEEE Electron Device Lett.
dc.source.issue5
dc.source.volume16
imec.availabilityPublished - imec


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