Show simple item record

Why are nonlinear microwave systems measurements so involved?

dc.contributor.authorRolain, Yves
dc.contributor.authorVan Moer, Wendy
dc.contributor.authorSchoukens, Johan
dc.contributor.authorVandersteen, Gerd
dc.date.accessioned2021-10-15T15:53:53Z
dc.date.available2021-10-15T15:53:53Z
dc.date.issued2004-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9525
dc.sourceIIOimport
dc.titleWhy are nonlinear microwave systems measurements so involved?
dc.typeJournal article
dc.contributor.imecauthorVandersteen, Gerd
dc.source.peerreviewno
dc.source.beginpage726
dc.source.endpage729
dc.source.journalIEEE Trans. Instrumation and Measurement
dc.source.issue3
dc.source.volume53
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record