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dc.contributor.authorRolain, Yves
dc.contributor.authorVan Moer, Wendy
dc.contributor.authorSchoukens, Johan
dc.contributor.authorVandersteen, Gerd
dc.date.accessioned2021-10-15T15:53:53Z
dc.date.available2021-10-15T15:53:53Z
dc.date.issued2004-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9525
dc.sourceIIOimport
dc.titleWhy are nonlinear microwave systems measurements so involved?
dc.typeJournal article
dc.contributor.imecauthorVandersteen, Gerd
dc.source.peerreviewno
dc.source.beginpage726
dc.source.endpage729
dc.source.journalIEEE Trans. Instrumation and Measurement
dc.source.issue3
dc.source.volume53
imec.availabilityPublished - imec


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