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Characterization of the spatial charge distribution in local charge-trapping memory devices using the charge-pumping technique

dc.contributor.authorRosmeulen, Maarten
dc.contributor.authorBreuil, Laurent
dc.contributor.authorLorenzini, Martino
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-15T15:54:32Z
dc.date.available2021-10-15T15:54:32Z
dc.date.issued2004-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9527
dc.sourceIIOimport
dc.titleCharacterization of the spatial charge distribution in local charge-trapping memory devices using the charge-pumping technique
dc.typeJournal article
dc.contributor.imecauthorRosmeulen, Maarten
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecRosmeulen, Maarten::0000-0002-3663-7439
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewno
dc.source.beginpage1525
dc.source.endpage1530
dc.source.journalSolid-State Electronics
dc.source.issue9
dc.source.volume48
imec.availabilityPublished - imec


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