dc.contributor.author | van Veen, Co | |
dc.contributor.author | Vandevelde, Bart | |
dc.contributor.author | Beyne, Eric | |
dc.date.accessioned | 2021-10-15T17:17:59Z | |
dc.date.available | 2021-10-15T17:17:59Z | |
dc.date.issued | 2004 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9803 | |
dc.source | IIOimport | |
dc.title | Influence of solder joint shape on the thermo-mechanical reliability of CSP's | |
dc.type | Journal article | |
dc.contributor.imecauthor | Vandevelde, Bart | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Vandevelde, Bart::0000-0002-6753-6438 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.source.peerreview | no | |
dc.source.beginpage | 53 | |
dc.source.endpage | 63 | |
dc.source.journal | Journal of Microelectronics and Electronic Packaging | |
dc.source.issue | 2 | |
dc.source.volume | 1 | |
imec.availability | Published - imec | |