Impact of current crowding on electromigration-induced mass transport
dc.contributor.author | Wang, Hui | |
dc.contributor.author | Bruynseraede, Christophe | |
dc.contributor.author | Maex, Karen | |
dc.date.accessioned | 2021-10-15T17:49:32Z | |
dc.date.available | 2021-10-15T17:49:32Z | |
dc.date.issued | 2004 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9901 | |
dc.source | IIOimport | |
dc.title | Impact of current crowding on electromigration-induced mass transport | |
dc.type | Journal article | |
dc.contributor.imecauthor | Maex, Karen | |
dc.source.peerreview | no | |
dc.source.beginpage | 517 | |
dc.source.endpage | 519 | |
dc.source.journal | Applied Physics Letters | |
dc.source.issue | 4 | |
dc.source.volume | 84 | |
imec.availability | Published - imec |
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