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Impact of current crowding on electromigration-induced mass transport

dc.contributor.authorWang, Hui
dc.contributor.authorBruynseraede, Christophe
dc.contributor.authorMaex, Karen
dc.date.accessioned2021-10-15T17:49:32Z
dc.date.available2021-10-15T17:49:32Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9901
dc.sourceIIOimport
dc.titleImpact of current crowding on electromigration-induced mass transport
dc.typeJournal article
dc.contributor.imecauthorMaex, Karen
dc.source.peerreviewno
dc.source.beginpage517
dc.source.endpage519
dc.source.journalApplied Physics Letters
dc.source.issue4
dc.source.volume84
imec.availabilityPublished - imec


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