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Optical spectroscopy of the density of gap states in ETP-deposited a-Si:H

dc.contributor.authorWillekens, J.
dc.contributor.authorBrinza, M.
dc.contributor.authorGungor, B.
dc.contributor.authorAdriaenssens, G.J.
dc.contributor.authorNesladek, Milos
dc.contributor.authorKessels, W.M.M.
dc.contributor.authorSmets, A.H.M.
dc.contributor.authorVan de Sanden, M.C.M.
dc.date.accessioned2021-10-15T17:55:55Z
dc.date.available2021-10-15T17:55:55Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9920
dc.sourceIIOimport
dc.titleOptical spectroscopy of the density of gap states in ETP-deposited a-Si:H
dc.typeJournal article
dc.contributor.imecauthorNesladek, Milos
dc.source.peerreviewno
dc.source.beginpage244
dc.source.endpage248
dc.source.journalJournal of Non-Crystalline Physics
dc.source.volume338-340
imec.availabilityPublished - imec


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