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Hole traps in silicon dioxides - Part I: Properties

dc.contributor.authorZhang, J.F.
dc.contributor.authorZhao, C.Z.
dc.contributor.authorChen, A.H.
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDegraeve, Robin
dc.date.accessioned2021-10-15T18:12:50Z
dc.date.available2021-10-15T18:12:50Z
dc.date.issued2004-08
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9970
dc.sourceIIOimport
dc.titleHole traps in silicon dioxides - Part I: Properties
dc.typeJournal article
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.source.peerreviewno
dc.source.beginpage1267
dc.source.endpage1273
dc.source.journalIEEE Trans. Electron Devices
dc.source.issue8
dc.source.volume51
imec.availabilityPublished - imec


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