Browsing by Author "Abbasi, Arash"
Now showing 1 - 2 of 2
- Results Per Page
- Sort Options
Publication Extraction of statistical gate oxide parameters from large MOSFET arrrays
Journal article2020, IEEE Transactions on Device and Materials Reliability, (20) 2, p.251-257Publication Statistical characterization of BTI and RTN using pMOS arrays
Proceedings paper2019, IEEE International Integrated Reliability Workshop (IIRW), 13/10/2019