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    Depth Resolution and Ripple Formation on AlxGa 1-xAs

    Elst, Kathy
    ;
    Tian, Chunsheng
    ;
    Vandervorst, Wilfried  
    ;
    Adams, F.
    Oral presentation
    1995, 10th International Conference on Secondary Ion Mass Spectrometry (SIMS X); October 1-6, 1995; Münster, Germany.

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