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Browsing by Author "Adelmann, Chris"

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    Achieving Low-VT Ni-FUSI CMOS by ultra-thin Dy2O3 capping of hafnium silicate dielectrics

    Veloso, Anabela  
    ;
    Yu, HongYu
    ;
    Chang, S.Z.
    ;
    Adelmann, Chris
    ;
    Onsia, Bart  
    ;
    Brus, Stephan  
    Journal article
    2007, IEEE Electron Device Letters, (28) 11, p.980-983

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