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Browsing by Author "Aertgeerts, R."

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    Publication

    Study of GHz-SAM sensitivity to delamination in BEOL layers

    Khaled, Ahmad  
    ;
    Kljucar, Luka  
    ;
    Brand, Sebastian
    ;
    Kögel, Michael
    ;
    Aertgeerts, R.
    ;
    Nicasy, R.
    Journal article
    2017, Microelectronics Reliability, 76-77, p.238-242

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