Browsing by Author "Aguilera, A. M."

Now showing 1 - 2 of 2

Reversible dielectric breakdown in h-BN stacks: a statistical study of the switching voltages

Roldan, J. B.
;
Maldonado, D.
;
Jimenez-Molinos, F.
;
Acal, C.
;
Ruiz-Castro, J. E.
;
Aguilera, A. M.
Proceedings paper
2020, IEEE International Reliability Physics Symposium (IRPS), APR 28-MAY 30, 2020
Time series modeling of the cycle-to-cycle variability in h-BN based memristors

Roldan, J. B.
;
Maldonado, D.
;
Alonso, F. J.
;
Roldan, A. M.
;
Hui, F.
;
Jimenez-Molinos, F.
Proceedings paper
2021, IEEE International Reliability Physics Symposium (IRPS), MAR 21-24, 2021