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Browsing by Author "Avery, L."

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    Investigation into socketed CDM (SDM) tester parasitics

    Chaine, M.
    ;
    Verhaege, K.
    ;
    Avery, L.
    ;
    Kelly, M.
    ;
    Gieser, H.
    ;
    Bock, Karlheinz
    ;
    Henry, L. G.
    ;
    Meuse, T.
    Journal article
    1999, Microelectronics and Reliability, (39) 11, p.1531-1540

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