Browsing by Author "Balasch, J."

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An in-depth and black- box characterization of the effects of laser pulses on ATmega328P

Kumar, D.S.
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Beckers, A.
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Balasch, J.
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Gierlichs, B.
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Verbauwhede, I.
Proceedings paper
2019, Smart Card Research and Advanced Applications - CARDIS 2018, 12/11/2018, p.156-170
Characterization of EM faults on ATmega328p

Beckers, Arthur
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Balasch, J.
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Gierlichs, B.
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Verbauwhede, I.
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Osuka, S.
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Kinugawa, M.
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Fujimoto, D.
Proceedings paper
2019, 2019 Joint International Symposium on Electromagnetic Compatibility and Asia-Pacific International Symposium on Electromagnetic, 3/06/2019, p.1-4
Design and evaluation of a spark gap based EM-fault injection setup

Beckers, A.
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Kinugawa, M.
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Hayashi, Y.
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Balasch, J.
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Verbauwhede, I.
Proceedings paper
2020, 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 28/07/2020
EM information security threats against RO-based TRNGs: The frequency injection attack based on IEMI and EM information leakage

Osuka, S
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Fujimoto, D.
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Hayashi, Y.
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Homma, N.
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Beckers, A.
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Balasch, J.
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Gierlichs, B.
Journal article
2019, IEEE Transactions on Electromagnetic Compatibility, (1) 4, p.1122-1128