Browsing by Author "Bayliss, S. C."

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Confocal microscopy and spectroscopy of InGaN epilayers on sapphire

O'Donnell, K. P.
;
Tobin, M. J.
;
Bayliss, S. C.
;
Van der Stricht, Wim
Journal article
1999, Journal of Microscopy, (193) 2, p.105-108
Energy-dispersive x-ray imaging of an InGaN/GaN bilayer on sapphire

O'Donnell, K. P.
;
Middleton, P. G.
;
Trager-Cowan, C.
;
Young, C.
;
Bayliss, S. C.
;
Fletcher, I.
Journal article
1998, Applied Physics Letters, (73) 22, p.3273-3275
Spectroscopy and microscopy of localised and delocalised excitons in InGaN-based light emitting diodes and epilayers

O'Donnell, K. P.
;
Martin, R. W.
;
Middleton, P. G.
;
Bayliss, S. C.
;
Fletcher, I.
;
Van der Stricht, Wim
Journal article
1999, Materials Science and Engineering. B, (B59) 1_3, p.288-291
The optical and structural properties of InGaN epilayers with very high indium content

Bayliss, S. C.
;
Demeester, Piet
;
Fletcher, I.
;
Martin, R. W.
;
Middleton, P. G.
;
Moerman, Ingrid
Journal article
1999, Materials Science and Engineering. B, (B59) 1_3, p.292-297