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Browsing by Author "Bean, J. C."

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    Localised strain characterisation in semiconductor structures using electron diffraction contrast imaging

    Janssens, Koenraad
    ;
    Van Der Biest, O.
    ;
    Vanhellemont, Jan
    ;
    Maes, Herman
    ;
    Hull, R.
    ;
    Bean, J. C.
    Journal article
    1995, Materials Science and Technology, (11) 1, p.66-71

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