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Browsing by Author "Beebe, M."

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    Sputter rate variations in silicon under high k dielectric films

    Benett, Joe
    ;
    Vandervorst, Wilfried  
    ;
    Beebe, M.
    ;
    Sparks, C.
    ;
    Gondran, C.
    Meeting abstract
    2003, International Conference on Secondary Ion Mass Spectrometry - SIMS XIV, 14/09/2003, p.82
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    Sputter rate variations in silicon under high-k dielectric films

    Bennett, J.
    ;
    Beebe, M.
    ;
    Sparks, C.
    ;
    Gondran, C.
    ;
    Vandervorst, Wilfried  
    Journal article
    2004, Applied Surface Science, 231-232, p.565-568
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    Sputter rate variations in silicon under high-k dielectric films

    Bennett, J.
    ;
    Beebe, M.
    ;
    Sparks, C.
    ;
    Gondran, C.
    ;
    Vandervorst, Wilfried  
    Proceedings paper
    2004-05, Proceedings of the Fourteenth Int. Conference on Secondary Ion Mass Spectrometry and Related Topics, 14/09/2003, p.565-568

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