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Browsing by Author "Beech, C. D."

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    Generation of mobile hydrogenous ions in gate oxide and their potential applications

    Zhao, C.
    ;
    Zhang, J.F.
    ;
    Groeseneken, Guido  
    ;
    Degraeve, Robin  
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    Ellis, J. N.
    ;
    Beech, C. D.
    Journal article
    2001, Electronics Letters, (37) 11, p.716-717
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    Hydrogen induced and plasma charging enhanced positive charge generation in gate oxides

    Zhao, C.Z.
    ;
    Zhang, J.F.
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    Groeseneken, Guido  
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    Degraeve, Robin  
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    Ellis, J. N.
    ;
    Beech, C. D.
    Proceedings paper
    2000, 5th International Symposium on Plasma Process-Induced Damage, 23/05/2000, p.129-132
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    Hydrogen induced positive charge generation in gate oxides

    Zhang, J.F.
    ;
    Zhao, C.Z.
    ;
    Groeseneken, Guido  
    ;
    Degraeve, Robin  
    ;
    Ellis, J. N.
    ;
    Beech, C. D.
    Journal article
    2001, Journal of Applied Physics, (90) 4, p.1911-1919
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    Interface state generation after hole injection

    Zhao, C.Z.
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    Zhang, C.D.
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    Groeseneken, Guido  
    ;
    Degraeve, Robin  
    ;
    Ellis, J. N.
    ;
    Beech, C. D.
    Journal article
    2001, Journal of Applied Physics, (90) 1, p.328-336
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    Relation between hole traps and non-reactive hydrogen induced positive charges

    Zhang, J.
    ;
    Zhao, C.D.
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    Groeseneken, Guido  
    ;
    Degraeve, Robin  
    ;
    Ellis, J. N.
    ;
    Beech, C. D.
    Journal article
    2001, Microelectronic Engineering, (59) 1_4, p.67-72

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