Browsing by Author "Beenakker, Kees"
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Publication Test cost analysis for 3D die-to-wafer stacking
Proceedings paper2010-12, IEEE Asian Test Symposium - ATS, 1/12/2010, p.435-441Publication Test impact on the overall die-to-wafer 3D stacked IC cost
Journal article2012-02, Journal of Electronic Testing - Theory and Applications (JETTA), (28) 1, p.15-25