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Publication
Noise coupling between TSVs and active devices: planar nMOSFETs vs. nFinFETs
Sun, Xiao
;
Rouhi Najaf Abadi, Alireza
;
Guo, Wei
;
Bel Ali, K.
;
Rack, M.
;
Roda Neve, Cesar
;
Choi, M.
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Proceedings paper
2015,
IEEE 65th Electronic Components & Technology Conference - ECTC,
26/05/2015,
p.260-265