Browsing by Author "Benstetter, G."
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication New trends in the application of scanning probe techniques in failure analysis
;Schweinbock, T. ;Schömann, S. ;Alvarez, David ;Buzzo, M. ;Frammelsberger, W.Breitschopf, P.Journal article2004, Microelectronics Reliability, (44) 9_11, p.1541-1546