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Browsing by Author "Besling, W.F.A."

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    Characterization of TiN films deposited by atomic layer deposition

    Besling, W.F.A.
    ;
    Satta, Alessandra
    ;
    Schuhmacher, Jörg
    ;
    Beyer, Gerald  
    ;
    Maex, Karen  
    ;
    Kilpela, Olli
    Proceedings paper
    2002, Proceedings of the 3rd AVS International Conference on Microelectronics and Interfaces, 11/02/2002, p.56-58
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    Integration of low-k dielectric films in damascene processes

    Hoofman, Romano  
    ;
    Nguyen Hoang, Viet
    ;
    Arnal, V.
    ;
    Broekaart, M.
    ;
    Gosset, L.G.
    ;
    Besling, W.F.A.
    Book chapter
    2007

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