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Browsing by Author "Bijkerk, Fred"

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    Advancing X-ray metrology for routine thin film analysis

    Makhotkin, Igor  
    ;
    Fathabad, Zahra
    ;
    Yakunin, Sergey
    ;
    van de Kruijs, Robbert
    ;
    Philipsen, Vicky  
    Proceedings paper
    2018, 13th International MicroNanoConference - iMNC, 11/12/2018

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