Browsing by Author "Bisiaux, Pierre"
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Publication Application of FFT-scanning spreading resistance microscopy to the analysis of poly-silicon solar-cells
Oral presentation2014, E-MRS Fall Meeting Symposium H: Local Probing Techniques and In-Situ Measurements of Energy Storage and Conversion MaterialsPublication Development and evaluation of the Fast Fourier Transform-SSRM technique
Meeting abstract2014, MRS Spring Meeting Symposium BBB: Advances in Scanning Probe Microscopy for Material Properties, 21/04/2014, p.BBB6.03Publication Fast Fourier transform scanning spreading resistance microscopy: a novel technique to overcome the limitations of classical conductive AFM techniques
Journal article2015, Nanotechnology, (26) 35, p.5702Publication Increasing the performances of the SSRM technique introducing the FFT-SSRM mode
Oral presentation2014, Forum des Microscopies à Sonde Locale - FSL