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Browsing by Author "Bonjean, F."

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    Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips

    Criel, Steven
    ;
    Bonjean, F.
    ;
    De Smedt, R.
    ;
    De Moerloose, Jan
    ;
    Martens, Luc  
    ;
    Olyslager, Frank
    Proceedings paper
    1998, International Symposium on Electromagnetic Compatibility. Symposium Record, 24/08/1998, p.734-738

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