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Browsing by Author "Boonen, S."

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    Plasma damage in HIMOSTM non-volatile memories (NVM)

    Ackaert, J.
    ;
    Lowe, A.
    ;
    De Backer, E.
    ;
    Boonen, S.
    ;
    Yao, T.
    ;
    Van Houdt, Jan  
    ;
    Haspeslagh, Luc  
    Proceedings paper
    2004-05, IEEE International Conference on Integrated Circuit Design and Technology - ICICDT, 17/05/2004, p.223-226

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