Browsing by Author "Boutsen, J."
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Publication Lifetime modeling of intrinsic gate oxide breakdown at high temperature
Journal article2007, Microelectronics Reliability, (47) 9_11, p.1389-1393Publication Molecular imprinted polymer films on RFID tags - a first step toward disposable packaging ssensors
Publication Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperature
Proceedings paper2007, 14th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA, 11/07/2007, p.288-291