Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Bracher, B."

Filter results by typing the first few letters
Now showing 1 - 1 of 1
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Profile analysis and the isofocal threshold in SEM metrology

    Bracher, B.
    ;
    Jonckheere, Rik  
    Oral presentation
    1994, Micro and Nano Engineering; 26-29 Sept. 1994; Davos, Switzerland.

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings