Browsing by Author "Brison, J."
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Publication Cesium/xenon dual beam depth profiling with TOF-SIMS: measurement and modeling of M+, MCs+, and M2Cs2+ yields
Proceedings paper2004-05, Proceedings of the 14th Int. Conference on Secondary Ion Mass Spectrometry and Related Topics - SIMS XIV, 14/09/2003, p.749-753Publication Cesium/xenon dual beam depth profiling with TOF-SIMS: measurement and modeling of M+, MCs+, and MCS2)-C-2 (+) yields
Journal article2004, Applied Surface Science, 231-232, p.749-753