Browsing by Author "Brown, G."
Now showing 1 - 2 of 2
- Results Per Page
- Sort Options
Publication Effect of Fe contamination on quality of poly silicon gate structures
; ; ; ; Publication The impact of Fe and Cu on the minority carrier lifetime of P and N-type silicon wafers
Proceedings paper1995, ALTECH 95: Analytical Techniques for Semiconductor Materials and Process Characterization II. Proceedings of the Satellite Sympo, 28/09/1995, p.54-63