Browsing by Author "Brusamarello, Lucas"
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Publication Fast and accurate statistical characterization of standard cell libraries
Journal article2011, Microelectronics Reliability, (51) 12, p.2341-2350Publication Impact of line edge roughness on cell-to-cell coupling variability in NAND flash arrays
Proceedings paper2010-03, 11th International Conference on Ultimate Integration on Silicon - ULIS, 17/02/2010, p.41-44Publication Statistical characterization of standard cells using design of experiments and response surface modelling
Proceedings paper2011, 48th Design Automation Conference - DAC, 5/06/2011, p.77-82