Browsing by Author "Bukhori, M. F."
Now showing 1 - 2 of 2
- Results Per Page
- Sort Options
Publication 'Atomistic' simulation of RTS amplitudes due to single and multiple charged defect states and their interactions
Proceedings paper2010-10, IEEE International Integrated Reliability Workshop - IIRW, 17/10/2010, p.76-79Publication The relevance of deeply-scaled FET threshold voltage shifts for operation lifetimes
Proceedings paper2012, IEEE International Reliability Physics Symposium - IRPS, 15/04/2012, p.5A.2.1-5A.2.6