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Browsing by Author "Busnaina, Ahmed"

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    Collapse behavior and forces of multistack patterns

    Kim, Tae-Gon
    ;
    Wostyn, Kurt  
    ;
    Mertens, Paul  
    ;
    Busnaina, Ahmed
    ;
    Park, Jin Goo
    Proceedings paper
    2008, Sematech Surface Preparation and Cleaning Conference, 31/03/2008
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    Pattern collapse and particle removal forces of interest to semiconductor fabrication process

    Kim, Tae-Gon
    ;
    Wostyn, Kurt  
    ;
    Park, Jin-Goo
    ;
    Mertens, Paul  
    ;
    Busnaina, Ahmed
    Journal article
    2009, Solid State Phenomena, 145-146, p.47-50
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    Quantitative measurement of pattern collapse and particle removal force

    Kim, Tae-Gon
    ;
    Wostyn, Kurt  
    ;
    Mertens, Paul  
    ;
    Busnaina, Ahmed
    ;
    Park, Jin-Goo
    Proceedings paper
    2007, Cleaning and Surface Conditioning Technology in Semiconductor Device Manufacturing 10, 7/10/2007, p.123-129

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