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Browsing by Author "Buzzo, M."

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    Publication

    New trends in the application of scanning probe techniques in failure analysis

    Schweinbock, T.
    ;
    Schömann, S.
    ;
    Alvarez, David
    ;
    Buzzo, M.
    ;
    Frammelsberger, W.
    ;
    Breitschopf, P.
    Journal article
    2004, Microelectronics Reliability, (44) 9_11, p.1541-1546

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