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Browsing by Author "Candelori, A."

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    Heavy ion damage in ultra-thin gate oxide SOI MOSFETs

    Cester, A.
    ;
    Garardin, S.
    ;
    Paccagnella, A.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Candelori, A.
    Proceedings paper
    2005, 8th European Conference on Radiation and Its Effects on Components and Systems - RADECS, 19/09/2005

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