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Browsing by Author "Candido, Josue"

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    Gate-metal-dependent transition of leakage mechanisms in AlGaN/GaN HEMTs under temperature-dependent conditions

    de Andrade, Maria Gloria Cano
    ;
    Candido, Josue
    ;
    Simoen, Eddy  
    Journal article
    2026, MICROELECTRONICS RELIABILITY, 185, p.116260

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